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Session Abstract
Berkeley, California April 30-May 04
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2006.7624th IEEE VLSI Test Symposium
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Bernard Courtois, "Session Abstract," VLSI Test Symposium, IEEE, pp. 150-151, 24th IEEE VLSI Test Symposium, 2006.
 
 
BibTex
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@article{ 10.1109/VTS.2006.76,
author = {Bernard Courtois},
title = {Session Abstract},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2006},
isbn = {0-7695-2514-8},
pages = {150-151},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.76},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Session Abstract
SN - 0-7695-2514-8
SP150
EP151
A1 - Bernard Courtois,
PY - 2006
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Bernard Courtois, TIMA-France
According to the Moore?s Law, the number of transistors per integrated circuit doubles every 24 months, and it has been the guiding principle for the silicon semiconductor industry for over 30 years. The sustaining of the Moore?s Law, however, requires continued transistor scaling and performance improvement.
Citation:
Bernard Courtois, "Session Abstract," vts, pp.150-151, 24th IEEE VLSI Test Symposium, 2006
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