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Session Abstract
Berkeley, California April 30-May 04
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2006.7924th IEEE VLSI Test Symposium
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Michael Nicolaidis, "Session Abstract," VLSI Test Symposium, IEEE, pp. 286-287, 24th IEEE VLSI Test Symposium, 2006.
 
 
BibTex
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@article{ 10.1109/VTS.2006.79,
author = {Michael Nicolaidis},
title = {Session Abstract},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2006},
isbn = {0-7695-2514-8},
pages = {286-287},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.79},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Session Abstract
SN - 0-7695-2514-8
SP286
EP287
A1 - Michael Nicolaidis,
PY - 2006
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Michael Nicolaidis, TIMA Labs & iRoC Technologies
Three soft-error experts from industry will discuss the way their companies understand the impact of soft-errors on electronic systems, whether they consider soft-errors as an already existing or upcoming risk, whether they use or intent to introduce countermeasures and which are the best suited ones for their applications.
Citation:
Michael Nicolaidis, "Session Abstract," vts, pp.286-287, 24th IEEE VLSI Test Symposium, 2006
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