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Session Abstract
Berkeley, California April 30-May 04
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2006.8024th IEEE VLSI Test Symposium
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Andreas Veneris, Yiorgos Makris, "Session Abstract," VLSI Test Symposium, IEEE, pp. 290-291, 24th IEEE VLSI Test Symposium, 2006.
 
 
BibTex
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@article{ 10.1109/VTS.2006.80,
author = {Andreas Veneris and Yiorgos Makris},
title = {Session Abstract},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2006},
isbn = {0-7695-2514-8},
pages = {290-291},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.80},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Session Abstract
SN - 0-7695-2514-8
SP290
EP291
A1 - Andreas Veneris,
A1 - Yiorgos Makris,
PY - 2006
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Andreas Veneris, University of Toronto
Yiorgos Makris, Yale University
The aim of the TTTC Doctoral Thesis Award is to promote and strengthen the interaction between doctoral students who are about to graduate and the industrial community. It also serves as a process that allows their work to be exposed to and tested under real life industrial needs by experts in the field. This is achieved with student presentations in a dedicated VTS session in front of an industrial panel that evaluates, comments and contributes to their work in terms of novelty and advance of industrial practice and this of theoretical methodology.
Citation:
Andreas Veneris, Yiorgos Makris, "Session Abstract," vts, pp.290-291, 24th IEEE VLSI Test Symposium, 2006
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