"Test Technology Technical Council (TTTC),"
VLSI Test Symposium, IEEE, pp. xx, 24th IEEE VLSI Test Symposium, 2006.
BibTex
x
@article{
10.1109/VTS.2006.86, author = {}, title = {Test Technology Technical Council (TTTC)}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2006}, isbn = {0-7695-2514-8}, pages = {xx}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.86}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - VLSI Test Symposium, IEEE TI - Test Technology Technical Council (TTTC) SN - 0-7695-2514-8 SP EP PY - 2006 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -
Citation:
"Test Technology Technical Council (TTTC)," vts, pp.xx, 24th IEEE VLSI Test Symposium, 2006
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