An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories

April 27-May 01

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http://doi.ieeecomputersociety.org/10.1109/VTS.2008.33

26th IEEE VLSI Test Symposium (vts 2008)

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	Gurgen Harutunyan, Valery Vardanian, Yervant Zorian, "An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories," VLSI Test Symposium, IEEE, pp. 95-100, 26th IEEE VLSI Test Symposium (vts 2008), 2008.

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	@article{ 10.1109/VTS.2008.33, author = {Gurgen Harutunyan and Valery Vardanian and Yervant Zorian}, title = {An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2008}, issn = {1093-0167}, pages = {95-100}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.33}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories SN - 1093-0167 SP95 EP100 A1 - Gurgen Harutunyan, A1 - Valery Vardanian, A1 - Yervant Zorian, PY - 2008 KW - fault KW - detection KW - diagnosis KW - localization KW - march test VL - 0 JA - VLSI Test Symposium, IEEE ER -

Gurgen Harutunyan

Valery Vardanian

Yervant Zorian

Previously, a minimal algorithm of length 70N, N is the number of memory bits, was proposed for a subclass of dynamic faults. In this paper, a March-based fault location and full diagnosis algorithm of complexity 88N+29 is proposed for the same subclass of dynamic faults in bit-oriented SRAMs.

Index Terms:

fault, detection, diagnosis, localization, march test

Citation:

Gurgen Harutunyan, Valery Vardanian, Yervant Zorian, "An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories," vts, pp.95-100, 26th IEEE VLSI Test Symposium (vts 2008), 2008

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