Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation

April 27-May 01

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http://doi.ieeecomputersociety.org/10.1109/VTS.2008.42

26th IEEE VLSI Test Symposium (vts 2008)

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	Ritesh Garg, Richard Putman, Nur A. Touba, "Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation," VLSI Test Symposium, IEEE, pp. 35-42, 26th IEEE VLSI Test Symposium (vts 2008), 2008.

	BibTex	x
	@article{ 10.1109/VTS.2008.42, author = {Ritesh Garg and Richard Putman and Nur A. Touba}, title = {Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2008}, issn = {1093-0167}, pages = {35-42}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.42}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation SN - 1093-0167 SP35 EP42 A1 - Ritesh Garg, A1 - Richard Putman, A1 - Nur A. Touba, PY - 2008 KW - X-tolerant KW - Response Compaction KW - Linear Compression KW - Gaussian Elimination VL - 0 JA - VLSI Test Symposium, IEEE ER -

Ritesh Garg

Richard Putman

Nur A. Touba

Recently, an X-canceling MISR methodology was proposed in [Touba 07] which was based on providing very high probabilistic error coverage by canceling out X's in MISR signatures. This paper investigates a new methodology for using the x-canceling MISR architecture based on deterministically observing scan cells. The two main advantages of the proposed approach are (1) it can provide a higher amount of compaction, and (2) it is effective for larger percentages of X's in the output response. Also, this paper investigates a hybrid approach that combines X-masking with an X-canceling MISR. Experimental results indicate that significant amounts of output compression can be achieved with no loss of fault coverage.

Index Terms:

X-tolerant, Response Compaction, Linear Compression, Gaussian Elimination

Citation:

Ritesh Garg, Richard Putman, Nur A. Touba, "Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation," vts, pp.35-42, 26th IEEE VLSI Test Symposium (vts 2008), 2008

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