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A Time-Domain Method for Pseudo-Spectral Characterization
April 27-May 01
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2008.5026th IEEE VLSI Test Symposium (vts 2008)
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We present a generic method for determining transfer function of a DUT using simple time-domain computations in place of conventional computationally intensive frequency domain methods. Our method uses a chirp stimulus and an average of absolute value to extract energy in different frequency bins. For an N0-size spectrum, this enables a reduction of computational complexity from N0*ln(N0) multiply-accumulates (using an FFT) to N0 accumulates. This makes it an attractive strategy for BIST. We present the theoretical basis, test case simulations, and a comparison with the FFT method.
Index Terms:
mixed-signal test, analog test, bist, fft
Citation:
Apurva Mishra, Mani Soma, "A Time-Domain Method for Pseudo-Spectral Characterization," vts, pp.163-168, 26th IEEE VLSI Test Symposium (vts 2008), 2008
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