Diagnosis of Scan Clock Failures

April 27-May 01

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http://doi.ieeecomputersociety.org/10.1109/VTS.2008.59

26th IEEE VLSI Test Symposium (vts 2008)

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	ASCII Text	x
	King Leong Lee, Nadir Z. Basturkmen, Srikanth Venkataraman, "Diagnosis of Scan Clock Failures," VLSI Test Symposium, IEEE, pp. 67-72, 26th IEEE VLSI Test Symposium (vts 2008), 2008.

	BibTex	x
	@article{ 10.1109/VTS.2008.59, author = {King Leong Lee and Nadir Z. Basturkmen and Srikanth Venkataraman}, title = {Diagnosis of Scan Clock Failures}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2008}, issn = {1093-0167}, pages = {67-72}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.59}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Diagnosis of Scan Clock Failures SN - 1093-0167 SP67 EP72 A1 - King Leong Lee, A1 - Nadir Z. Basturkmen, A1 - Srikanth Venkataraman, PY - 2008 KW - diagnosis KW - scan clock KW - scan chain VL - 0 JA - VLSI Test Symposium, IEEE ER -

King Leong Lee

Nadir Z. Basturkmen

Srikanth Venkataraman

In this paper we present a fault diagnosis procedure for defects in the scan clock tree. We first identify the candidate clock tree buffers common to failing chains by backtracing. We then evaluate and rank these candidates by forward tracing and simulation. Experimental results show that the proposed procedure provides accurate diagnosis of scan clock failures.

Index Terms:

diagnosis, scan clock, scan chain

Citation:

King Leong Lee, Nadir Z. Basturkmen, Srikanth Venkataraman, "Diagnosis of Scan Clock Failures," vts, pp.67-72, 26th IEEE VLSI Test Symposium (vts 2008), 2008

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