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FINT: Tool Support for Aspect Mining
Benevento, Italy October 23-October 27
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/WCRE.2006.3013th Working Conference on Reverse En ...
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Marius Marin, Leon Moonen, Arie van Deursen, "FINT: Tool Support for Aspect Mining," Reverse Engineering, Working Conference on, pp. 299-300, 13th Working Conference on Reverse Engineering (WCRE 2006), 2006.
 
 
BibTex
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@article{ 10.1109/WCRE.2006.30,
author = {Marius Marin and Leon Moonen and Arie van Deursen},
title = {FINT: Tool Support for Aspect Mining},
journal ={Reverse Engineering, Working Conference on},
volume = {0},
year = {2006},
issn = {1095-1350},
pages = {299-300},
doi = {http://doi.ieeecomputersociety.org/10.1109/WCRE.2006.30},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Reverse Engineering, Working Conference on
TI - FINT: Tool Support for Aspect Mining
SN - 1095-1350
SP299
EP300
A1 - Marius Marin,
A1 - Leon Moonen,
A1 - Arie van Deursen,
PY - 2006
KW - null
VL - 0
JA - Reverse Engineering, Working Conference on
ER -
 
Marius Marin, Delft University of Technology, Netherlands
Leon Moonen, Delft Univ. of Technology & CWI, The Netherlands
Arie van Deursen, Delft Univ. of Technology & CWI, The Netherlands
Aspect mining requires adequate tool support to locate source code elements implementing crosscutting concerns (aka seeds), to explore and understand relations describing these elements, and to manage concerns and seeds during the project's life cycle.

FINT is a tool implemented as an Eclipse plug-in that presently supports a number of techniques for the automatic identification of crosscutting concern seeds in source code. Furthermore, FINT allows for combination of mining techniques (results), facilitates code navigation and comprehension to reason and decide about candidate-seeds, and supports seeds management and persistence.

Citation:
Marius Marin, Leon Moonen, Arie van Deursen, "FINT: Tool Support for Aspect Mining," wcre, pp.299-300, 13th Working Conference on Reverse Engineering (WCRE 2006), 2006
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