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May/June 2009

Guest Editors' Introduction:

The Status of IEEE Std 1500—Part 2

Erik Jan Marinissen and Yervant Zorian

In this special issue of IEEE Design & Test, we take another look at the status of IEEE Std 1500. Unlike many sequels that Hollywood produces in response to its products, the contents of this Part 2 are at least as good as what we published in Part 1.
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Mission Statement:

IEEE Design & Test of Computers offers original works describing tools, techniques, concepts, and systems used to design and test electronic product hardware and supportive software. The magazine focuses on current and near-future practice, and includes tutorials, how-to-articles, and real-world case studies.

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Design & Test has begun expanding into a new format. As part of Computing Now, Design & Test will now give you free access to peer-reviewed articles and departments from all of the IEEE Computer Society's 13 magazines. To sign up for regular updates, visit http://computingnow.computer.org/newsletter.

Special Feature

An interview with Intel Chair Craig Barrett

View highlights from the Craig Barrett interview that appeared in the July-August 2008 issue of Design & Test on Computing Now

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	D&T works so well for me because it combines well-written and informative articles that cover an interesting area of design or test with features such as interviews and roundtables which give us insight into the big issues in our field. D&T is the only design and test oriented publication I know of to give both direct access to new ideas and commentary on these ideas in one place.

	- Scott Davidson, Sr. Staff Engineer, Sun Microsystems